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Proceedings Paper

Spectral polarization signatures of materials in the LWIR
Author(s): Matthew P. Fetrow; Stephanie H. Sposato; Kenneth P. Bishop; Thomas R. Caudill
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Paper Abstract

The emitted polarization signature of materials is of interest for use in discriminating targets from cluttered backgrounds. In addition, spectrally varying polarization signatures might be used for material identification or to separate target and environment radiance contributions. A spectrally filtered LWIR Imaging Polarimeter (LIP) has been constructed and used in the lab and in the field to make signature measurements of controlled targets. In addition, a full-stokes FTIR Polarization Spectrometer (FSP) has been constructed for higher spectral resolution measurements of materials. This paper will discuss the instruments, calibration methods, general operation, and results characterizing the emitted polarization properties of materials as a function of wavelength.

Paper Details

Date Published: 15 November 2000
PDF: 12 pages
Proc. SPIE 4133, Polarization Analysis, Measurement, and Remote Sensing III, (15 November 2000); doi: 10.1117/12.406633
Show Author Affiliations
Matthew P. Fetrow, Air Force Research Lab. (United States)
Stephanie H. Sposato, Air Force Research Lab. (United States)
Kenneth P. Bishop, Applied Technology Associates (United States)
Thomas R. Caudill, Air Force Research Lab. (United States)

Published in SPIE Proceedings Vol. 4133:
Polarization Analysis, Measurement, and Remote Sensing III
David B. Chenault; Walter G. Egan; Michael J. Duggin; Michael J. Duggin; Walter G. Egan; Dennis H. Goldstein, Editor(s)

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