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Proceedings Paper

Measurement results from flight measurements with the hyperspectral imaging polarimeter
Author(s): Gary L. Jensen; James Q. Peterson; Mark E. Greenman; Pedro E. Sevilla; Kirk D. Larsen; Joseph A. Kristl
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Paper Abstract

The Space Dynamics Laboratory at Utah State University has built and flown an airborne infrared Hyperspectral Imaging Polarimeter (HIP) as a proof-of-principle sensor for a satellite-based polarimeter. This paper briefly reviews the instrument design that was presented in previous SPIE papers1,2, details the changes and improvements made between the 1998 and 1999 measurements, and presents measurement data from the flights. Measurement data from a series of flights in 1998 indicated the need for wider-band measurements than could be made with our ferroelectric liquid crystal polarimeter design. For this reason, the existing sensor was modified to use a rotating wire-grid polarization filter. The reasons for this choice, equipment design, and measurement equations will be given. A short description of the 1999 flights aboard FISTA3 (Flying Infrared Signatures Technology Aircraft), an Air Force KC-135 based at Edwards Air Force Base will be given, as well as a small sample of the four-dimensional data set will be presented.

Paper Details

Date Published: 15 November 2000
PDF: 7 pages
Proc. SPIE 4133, Polarization Analysis, Measurement, and Remote Sensing III, (15 November 2000); doi: 10.1117/12.406628
Show Author Affiliations
Gary L. Jensen, Space Dynamics Lab./Utah State Univ. (United States)
James Q. Peterson, Space Dynamics Lab./Utah State Univ. (United States)
Mark E. Greenman, Space Dynamics Lab./Utah State Univ. (United States)
Pedro E. Sevilla, Space Dynamics Lab./Utah State Univ. (United States)
Kirk D. Larsen, Space Dynamics Lab./Utah State Univ. (United States)
Joseph A. Kristl, Stewart Radiance Lab./Utah State Univ. (United States)


Published in SPIE Proceedings Vol. 4133:
Polarization Analysis, Measurement, and Remote Sensing III
David B. Chenault; Michael J. Duggin; Walter G. Egan; Dennis H. Goldstein; Walter G. Egan; Michael J. Duggin, Editor(s)

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