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Proceedings Paper

High-order birefringence measurement using spectroscopic polarized light
Author(s): Hiroyuki Kowa; Kanae Muraki; Yukitoshi Otani; Norihiro Umeda; Toru Yoshizawa
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Paper Abstract

The paper covers an issue of method and device for measurement of two-dimensional retardance with high-order and azimuthal direction. The system based on the use of a crossed polarizer by changing spectroscopic polarized light. Sixty-four sets of images are used for birefringence analysis. The spectroscopic interferogram change sinusoidal with wave number and the period is in proportion to birefringence of specimen. The measured results of the two dimensional birefringence distribution of a plastic and standard phase plate of retardation are shown. Fourier transform method and maximum entropy method enable to measure birefringence with high resolution. Two examples, measurement of aligned polymer film, which is laminated as steps, and that of birefringence distribution, are demonstrated.

Paper Details

Date Published: 15 November 2000
PDF: 4 pages
Proc. SPIE 4133, Polarization Analysis, Measurement, and Remote Sensing III, (15 November 2000); doi: 10.1117/12.406620
Show Author Affiliations
Hiroyuki Kowa, Uniopt Co., Ltd. and Tokyo Univ. of Agriculture and Technology (Japan)
Kanae Muraki, Uniopt Co., Ltd. (Japan)
Yukitoshi Otani, Tokyo Univ. of Agriculture and Technology (Japan)
Norihiro Umeda, Tokyo Univ. of Agriculture and Technology (Japan)
Toru Yoshizawa, Tokyo Univ. of Agriculture and Technology (Japan)


Published in SPIE Proceedings Vol. 4133:
Polarization Analysis, Measurement, and Remote Sensing III
David B. Chenault; Walter G. Egan; Michael J. Duggin; Michael J. Duggin; Walter G. Egan; Dennis H. Goldstein, Editor(s)

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