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Proceedings Paper

Polarimetric characterization of Federal Standard paints
Author(s): Dennis H. Goldstein
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Paper Abstract

A limited polarimetric characterization of paint samples on aluminum substrates is presented. Twelve painted aluminum panels, representing various colors, reflectances, and surface finishes, were examined in a spectropolarimetric reflectometer. Data were analyzed in detail for the 0.9 to 1.0 micrometer wavelength region, although data were taken over a wider spectral range. Polarizance was measured for the twelve samples at eight input beam incidence angles. All observations were made from normal to the sample. Characterization of the surface roughness of the samples was done using profilometers. It was found that as the incidence beam angle increases, the polarizance increases; and as the reflectance of the sample decreases, the polarizance increases.

Paper Details

Date Published: 15 November 2000
PDF: 12 pages
Proc. SPIE 4133, Polarization Analysis, Measurement, and Remote Sensing III, (15 November 2000); doi: 10.1117/12.406618
Show Author Affiliations
Dennis H. Goldstein, Air Force Research Lab. (United States)


Published in SPIE Proceedings Vol. 4133:
Polarization Analysis, Measurement, and Remote Sensing III
David B. Chenault; Walter G. Egan; Michael J. Duggin; Michael J. Duggin; Walter G. Egan; Dennis H. Goldstein, Editor(s)

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