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Proceedings Paper

Mueller matrix measurements of black and white materials in the infrared
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Paper Abstract

We have investigated the degree of polarization (DOP) of infrared radiation reflected from rough white and black materials. Mueller matrices for these materials have been measured with an out-of-plane scatterometer with full polarization optics. We have compared the Mueller matrix data to the microfacet model. These results may have applications for stray light coatings for imaging polarimetric instruments.

Paper Details

Date Published: 15 November 2000
PDF: 10 pages
Proc. SPIE 4133, Polarization Analysis, Measurement, and Remote Sensing III, (15 November 2000); doi: 10.1117/12.406615
Show Author Affiliations
Steven R. Meier, Naval Research Lab. (United States)
Richard G. Priest, Naval Research Lab. (United States)


Published in SPIE Proceedings Vol. 4133:
Polarization Analysis, Measurement, and Remote Sensing III
David B. Chenault; Michael J. Duggin; Walter G. Egan; Dennis H. Goldstein; Walter G. Egan; Michael J. Duggin, Editor(s)

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