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Proceedings Paper

On-orbit calibration of the Naval EarthMap Observer (NEMO) coastal ocean imaging spectrometer (COIS)
Author(s): Curtiss O. Davis; Donald M. Horan; Michael R. Corson
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Paper Abstract

Production of science or Naval products from hyperspectral data requires the careful calibration of the sensor and the validation of the algorithms to demonstrate that they produce the correct products at the required accuracy. Thus a key part of the Navy’s Hyperspectral Remote Sensing Technology Program is the maintenance of accurate calibration for the Naval EarthMap Observer (NEMO) spacecraft’s Coastal Ocean Imaging Spectrometer (COIS) during the lifetime of the spacecraft. On-Orbit COIS is calibrated in three ways: Moon imaging, using on-board calibration lamps, and imaging of well characterized ocean and land scenes. The primary standard for COIS on-orbit calibration will be monthly imaging of the moon. The approach is similar to that used in NASA's SeaWiFS and MODIS programs, with the added complication that COIS images the Moon surface at much higher resolution than the NASA 1 km resolution sensors. On-board calibration lamps will not provide absolute calibration, but will be used to provide a stability check as frequently as once per orbit. Imaging the known reflectance land and open ocean sites will provide a data set for validating the calibration and atmospheric correction against measured surface reflectances. As an additional check COIS will be cross-calibrated with two well calibrated aircraft sensors, NRL’s Ocean PHILLS and NASA's AVIRIS, which will under-fly COIS and image the same ocean and land scenes.

Paper Details

Date Published: 15 November 2000
PDF: 10 pages
Proc. SPIE 4132, Imaging Spectrometry VI, (15 November 2000); doi: 10.1117/12.406594
Show Author Affiliations
Curtiss O. Davis, Naval Research Lab. (United States)
Donald M. Horan, Naval Research Lab. (United States)
Michael R. Corson, Research Support Instruments, Inc. (United States)


Published in SPIE Proceedings Vol. 4132:
Imaging Spectrometry VI
Michael R. Descour; Sylvia S. Shen, Editor(s)

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