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Proceedings Paper

Fabrication and testing of the IRS: the spectrograph on SIRTF
Author(s): James R. Houck; Thomas L. Roellig; Jeff Van Cleve; Bernhard Rainer Brandl; K. Uchida
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Paper Abstract

The Infrared Spectrograph, IRS, for SIRTF is a set of four compact low and medium resolution infrared spectrographs designed to work in the wavelength range from 5.3 - 40 micrometers at resolutions, (lambda) /(Delta) (lambda) from 65 to 600. The design involves all reflecting optics with no moving parts. The basic design philosophy, the fabrication process, the test program, and the real-time pointing capabilities are discussed.

Paper Details

Date Published: 16 November 2000
PDF: 8 pages
Proc. SPIE 4131, Infrared Spaceborne Remote Sensing VIII, (16 November 2000); doi: 10.1117/12.406574
Show Author Affiliations
James R. Houck, Cornell Univ. (United States)
Thomas L. Roellig, NASA Ames Research Ctr. (United States)
Jeff Van Cleve, Cornell Univ. (United States)
Bernhard Rainer Brandl, Cornell Univ. (United States)
K. Uchida, Cornell Univ. (United States)

Published in SPIE Proceedings Vol. 4131:
Infrared Spaceborne Remote Sensing VIII
Marija Strojnik; Bjorn F. Andresen, Editor(s)

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