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Proceedings Paper

Pattern matching based on a generalized Fourier transform
Author(s): Dinesh Nair; Ram Rajagopal; Lothar Wenzel
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Paper Abstract

In a two-dimensional pattern matching problem, a known template image has be located in another image, irrespective of the template's position, orientation and size in the image. One way to accomplish invariance to the changes in the template is by forming a set of feature vectors that encompass all the variations in the template. Matching is then performed by finding the best similarity between the feature vector extracted from the image to the feature vectors in the template set. In this paper we introduce a new concept of a generalized Fourier transform. The generalized Fourier transform offers a relatively robust and extremely fast solution to the described matching problem. The application of the generalized Fourier transform to scale invariant pattern matching is shown here.

Paper Details

Date Published: 13 November 2000
PDF: 9 pages
Proc. SPIE 4116, Advanced Signal Processing Algorithms, Architectures, and Implementations X, (13 November 2000); doi: 10.1117/12.406527
Show Author Affiliations
Dinesh Nair, National Instruments Corp. (United States)
Ram Rajagopal, National Instruments Corp. (United States)
Lothar Wenzel, National Instruments Corp. (United States)


Published in SPIE Proceedings Vol. 4116:
Advanced Signal Processing Algorithms, Architectures, and Implementations X
Franklin T. Luk, Editor(s)

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