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Proceedings Paper

High-intensity monochromatic x-ray beam using doubly curved crystal optics
Author(s): Zewu Chen; Jeffrey P. Nicolich
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Paper Abstract

Doubly curved crystals of Mica, Ge and Si were bent according to Johann-Geometry. Point-to-point focusing of characteristic x-rays can be used to create a highly intense focal spot (50 micrometers FWHM) of 6.7 X 108 photons/s using a doubly curved Ge crystal and a 15 W Cr x-ray source. The output focal spot size was shown to be dependent on the spot size of the source. Focal spots of less than 50 micrometers were achieved. Doubly curved crystals have useful properties for monochromatic micro x-ray fluorescence measurements.

Paper Details

Date Published: 2 November 2000
PDF: 6 pages
Proc. SPIE 4144, Advances in Laboratory-based X-Ray Sources and Optics, (2 November 2000); doi: 10.1117/12.405886
Show Author Affiliations
Zewu Chen, X-Ray Optical Systems, Inc. (United States)
Jeffrey P. Nicolich, X-Ray Optical Systems, Inc. (United States)

Published in SPIE Proceedings Vol. 4144:
Advances in Laboratory-based X-Ray Sources and Optics
Carolyn A. MacDonald; Ali M. Khounsary, Editor(s)

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