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Proceedings Paper

X-ray investigations of a near surface layer of metal samples
Author(s): Oleg N. Gilev; Victor E. Asadchikov; Angela Duparre; Nikolai A. Havronin; Igor V. Kozhevnikov; Yury S. Krivonosov; Sergey P. Kuznetsov; Vitaly I. Mikerov; Vladimir I. Ostashev; Vladimir A. Tukarev
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Paper Abstract

It is demonstrated that the simplest model of a surface, assuming step-like variation of the dielectric permeability at a vacuum-matter interface, does not permit the quantitative description of all the features of x-rays reflection and scattering observed in experiment, even though the effects of the surface roughness are taken into consideration accurately. These features are much more pronounced for metals having a large number of the conductivity electrons which are bound slightly with individual atoms. Evidently, the wave function of the electron gas of a metal cannot abrupt sharply at a surface but decreases gradually into vacuum at a distance of several angstroms. To validate or disprove the hypothesis for the presence of a near surface transition layer of the electron density in metals, a set of experiments is performed. Reflection and scattering of hard and soft x-rays, and cold neutrons (which are sensitive to nuclear density distribution and insensitive to the electron one) from metal samples are measured. The independent measurements of the surface micro-topography are performed with the use of atomic force microscopy. The results obtained demonstrate the presence of a near surface layer, which is caused by gradual change of electron density, with a thickness of several angstroms.

Paper Details

Date Published: 2 November 2000
PDF: 11 pages
Proc. SPIE 4099, Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries, (2 November 2000); doi: 10.1117/12.405828
Show Author Affiliations
Oleg N. Gilev, Russian Federal Nuclear Ctr. (Russia)
Victor E. Asadchikov, Institute of Crystallography (Russia)
Angela Duparre, Fraunhofer Institute for Applied Optics and Precision Engineering (Germany)
Nikolai A. Havronin, Russian Federal Nuclear Ctr. (Russia)
Igor V. Kozhevnikov, P.N. Lebedev Physical Institute (Russia)
Yury S. Krivonosov, Institute of Crystallography (Russia)
Sergey P. Kuznetsov, P.N. Lebedev Physical Institute (Russia)
Vitaly I. Mikerov, P.N. Lebedev Physical Institute (Russia)
Vladimir I. Ostashev, Russian Federal Nuclear Ctr. (Russia)
Vladimir A. Tukarev, P.N. Lebedev Physical Institute (Russia)


Published in SPIE Proceedings Vol. 4099:
Optical Metrology Roadmap for the Semiconductor, Optical, and Data Storage Industries
Ghanim A. Al-Jumaily; Angela Duparre; Bhanwar Singh, Editor(s)

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