Share Email Print

Proceedings Paper

U.S./Russian microsatellite for calibration of active ground-based optical collectors
Author(s): David G. Voelz; Jerry J. Sellers; Stephen A. Hanes; James R. Rotge; Victor D. Shargorodsky; Valeriy V. Shevchenko; Vladimir P. Vasiliev; V. A. Burmistov
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

A micro-satellite, designed to aid ground-based laser imaging, ranging, and sensing systems as a calibration target, has been constructed and is scheduled to be launched in the fall of 2000. This low-earth orbit satellite carries a set of retro- reflectors (for visible and near-infrared wavelengths) that present a spatially extended target to sites on the ground. Several of the reflectors also impart a polarization signature to the reflected laser light. This paper discusses the specifications of the retro-reflectors, positioning of the reflectors on the satellite structure, passive control of the vehicle orientation, and ground-pattern characteristics of the reflected light.

Paper Details

Date Published: 31 October 2000
PDF: 5 pages
Proc. SPIE 4091, Imaging Technology and Telescopes, (31 October 2000); doi: 10.1117/12.405786
Show Author Affiliations
David G. Voelz, Air Force Research Lab. (United States)
Jerry J. Sellers, Air Force Research Lab. (United Kingdom)
Stephen A. Hanes, Boeing Co. (United States)
James R. Rotge, Boeing Co. (United States)
Victor D. Shargorodsky, Scientific Research Institute for Precision Device Engineering (Russia)
Valeriy V. Shevchenko, Scientific Research Institute for Precision Device Engineering (Russia)
Vladimir P. Vasiliev, Scientific Research Institute for Precision Device Engineering (Russia)
V. A. Burmistov, Scientific Research Institute for Precision Device Engineering (Russia)

Published in SPIE Proceedings Vol. 4091:
Imaging Technology and Telescopes
James W. Bilbro; James B. Breckinridge; Mark J. Eckart; James B. Breckinridge; Richard A. Carreras; Richard A. Carreras; James W. Bilbro; Stanley R. Czyzak; Robert D. Fiete; Mark J. Eckart; Robert D. Fiete; Paul S. Idell, Editor(s)

© SPIE. Terms of Use
Back to Top