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Proceedings Paper

Raven automated small telescope systems
Author(s): Paul F. Sydney; John L. Africano; Amy Fredericks; Kris M. Hamada; Vicki Soo Hoo; Daron L. Nishimoto; Paul W. Kervin; Steve Bisque; Matthew Bisque
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Paper Abstract

The Raven optical sensor is a commercial system being developed and tested by the Air Force Research Laboratory. It allows for a low cost method for obtaining high accuracy angular observations of space objects (manmade and celestial) with a standard deviation of approximately one arcsecond or less. Presented here is an overview of the past and present successes and future projects utilizing Raven. This system has evolved into a very viable and cost effective solution for obtaining low-cost observations for satellite and asteroid catalog and follow-up maintenance. Collaborative efforts between AFRL and several space agencies (JPL, NASA, Space Battlelab, Canadian Defense Ministry, etc) have successfully demonstrated and utilized the Raven system for their missions, including improved satellite orbit determination accuracy, NEO follow-ups, and remote autonomous collecting and reporting of metric data on deep space objects.

Paper Details

Date Published: 31 October 2000
PDF: 11 pages
Proc. SPIE 4091, Imaging Technology and Telescopes, (31 October 2000); doi: 10.1117/12.405780
Show Author Affiliations
Paul F. Sydney, Boeing/Rocketdyne Technical Services (United States)
John L. Africano, Boeing/Rocketdyne Technical Services (United States)
Amy Fredericks, Boeing/Rocketdyne Technical Services (United States)
Kris M. Hamada, Boeing/Rocketdyne Technical Services (United States)
Vicki Soo Hoo, Boeing/Rocketdyne Technical Services (United States)
Daron L. Nishimoto, Oceanit, Inc. (United States)
Paul W. Kervin, Air Force Research Lab. (United States)
Steve Bisque, Software Bisque (United States)
Matthew Bisque, Software Bisque (United States)


Published in SPIE Proceedings Vol. 4091:
Imaging Technology and Telescopes
James W. Bilbro; James B. Breckinridge; Mark J. Eckart; James B. Breckinridge; Richard A. Carreras; Richard A. Carreras; James W. Bilbro; Stanley R. Czyzak; Robert D. Fiete; Mark J. Eckart; Robert D. Fiete; Paul S. Idell, Editor(s)

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