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Proceedings Paper

Applications of mixed-signal test strategies to next-generation microsystems
Author(s): Carl Jeffrey; Richard Rosing; Andrew Richardson
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Paper Abstract

Improvements in test technology for next generation microsystems is now becoming essential, especially in sensing applications as in most cases, each sensor has a unique set of characteristics causing inevitable difficulties associated with calibration and validation. Ideally, a microsystem should generate a calibrated output and a reliability indicator. IEEE1451.2 has been developed to provide a standard interface yet research into methods of providing these features through Built-In Self-Test and On- line monitoring techniques is still needed. One of the current industrial techniques uses multiple sensor to determine faults allowing systems to be temporarily reconfigured until the problems are resolved. This technique is only economical if multiple sensors with a strong functional correlation are present within the original system. In case only one sensor is present, using redundancies within this sensor would be more economical than adding extra sensors for test purposes. The aim of this paper is to review generic properties of sensor system to identify areas where mixed signal testing techniques could be adapted for sensor test and to identify areas for further research.

Paper Details

Date Published: 24 October 2000
PDF: 12 pages
Proc. SPIE 4228, Design, Modeling, and Simulation in Microelectronics, (24 October 2000); doi: 10.1117/12.405428
Show Author Affiliations
Carl Jeffrey, Lancaster Univ. (United Kingdom)
Richard Rosing, Lancaster Univ. (United Kingdom)
Andrew Richardson, Lancaster Univ. (United Kingdom)

Published in SPIE Proceedings Vol. 4228:
Design, Modeling, and Simulation in Microelectronics
Bernard Courtois; Serge N. Demidenko; Lee Y. Lau, Editor(s)

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