Share Email Print

Proceedings Paper

Applications of phase-retrieval x-ray diffractometry (PRXRD) to advanced characterization of materials used in photonic space systems
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A highly advanced experimental-analytical x-ray diffraction technique for the unique determination of material structure is discussed with respect to its possible application for the characterization of materials used in photonic space devices. The PRXRD technique allows one to determine, in great detail--at the level of a few angstrom, the physical dimensions and fine structure of crystalline materials. During the recent years the technique has been used successfully to determine the defects and fine structure of 1- and 2-D crystal-lattice strain distributions in SiGe- and GaAs-based heterostructures and in silicon crystals implanted with high-energy ions. There are materials that presently used in design of semiconductor lasers, detectors and ultra-high frequency telecommunication devices suitable for space applications. Recent atomic spatial resolution studies have allowed, for the first time, observation and preliminary analysis of surface and interface nano-scale sub-layers, where the crystal structure-factor may noticeably differ from the bulk material.

Paper Details

Date Published: 26 October 2000
PDF: 11 pages
Proc. SPIE 4134, Photonics for Space Environments VII, (26 October 2000); doi: 10.1117/12.405353
Show Author Affiliations
Andrei Yurievich Nikulin, Monash Univ. (Australia)

Published in SPIE Proceedings Vol. 4134:
Photonics for Space Environments VII
Edward W. Taylor, Editor(s)

© SPIE. Terms of Use
Back to Top