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Proceedings Paper

Systems engineering analysis of image quality
Author(s): James E. Harvey; Andrey Krywonos
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Paper Abstract

A linear systems approach (multiplying MTFs or convolving PSFs) to performing a complete systems engineering analysis of image quality is described. This includes not only the traditional diffraction analysis and the evaluation of image degradation from residual design errors: but also includes image degradation due to scattering effects from residual optical fabrication errors, assembly and alignment errors, and all other potential error sources appearing in a detailed error budget tree. The effects of mosaic detector arrays upon systems performance and the optimum system design will also be discussed. This analysis allows optical fabrication tolerances to be determined during the design phase of a program, frequently resulting in substantial cost and schedule savings. Inaccuracies in the linear systems assumption will be presented for several different applications.

Paper Details

Date Published: 24 October 2000
PDF: 10 pages
Proc. SPIE 4093, Current Developments in Lens Design and Optical Systems Engineering, (24 October 2000); doi: 10.1117/12.405229
Show Author Affiliations
James E. Harvey, CREOL/Univ. of Central Florida (United States)
Andrey Krywonos, CREOL/Univ. of Central Florida (United States)


Published in SPIE Proceedings Vol. 4093:
Current Developments in Lens Design and Optical Systems Engineering
Robert E. Fischer; Warren J. Smith; Robert E. Fischer; R. Barry Johnson; Warren J. Smith; William H. Swantner, Editor(s)

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