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Proceedings Paper

Interferogram processing with wavelet analysis and spectrogram reconstruction
Author(s): Jianjun Chu; Yuejuan Jiang; Quanchen Li; Dazun Zhao
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Paper Abstract

Spatial modulated imaging Fourier-transform spectrometers (SMIFTS) have the advantage of high Etendue (throughput), therefore, compared with the temporal modulated IFTS, the interferogram obtained from SMIFTS have higher Signal-to-Noise Ratio (SNR). Despite of this, noise on the interferogram will also affect the quality of the spectrograms, which were reconstructed from the interferogram by discrete Fourier- transform (DFT). This paper particularly describes the noise and its effect on the spectrogram and presents a novel method to preprocess the interferogram by using of Wavelet analysis. The result between this method and traditional low pass filtering is given as well.

Paper Details

Date Published: 10 October 2000
PDF: 4 pages
Proc. SPIE 4222, Process Control and Inspection for Industry, (10 October 2000); doi: 10.1117/12.403916
Show Author Affiliations
Jianjun Chu, Beijing Institute of Technology (China)
Yuejuan Jiang, Beijing Institute of Technology (China)
Quanchen Li, Beijing Institute of Technology (China)
Dazun Zhao, Beijing Institute of Technology (China)


Published in SPIE Proceedings Vol. 4222:
Process Control and Inspection for Industry
Shulian Zhang; Wei Gao, Editor(s)

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