Share Email Print
cover

Proceedings Paper

New progress in shearography
Author(s): Hong-Min Shi; Shouyong Ni; Lei Fu; Hao Wang
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

As common-path interferometers, shearography (shear interferometer) has been widely used in many fields. It has some special advantages as well as some disadvantages. This leads to the result that it can only be used in some special conditions for some special uses. Int his paper, both the advantages and the disadvantages are discussed. Some new progress, such as the phase-shift in shearography, two-dimensional shearography and the phot-carrier in shearography, are proposed. All of these new progress are developed in the aim of extending the application fields, improving the processing accuracy and realizing automatic measurement.

Paper Details

Date Published: 10 October 2000
PDF: 7 pages
Proc. SPIE 4222, Process Control and Inspection for Industry, (10 October 2000); doi: 10.1117/12.403912
Show Author Affiliations
Hong-Min Shi, Beijing Institute of Opto-Electronic Technology (China)
Shouyong Ni, Beijing Institute of Opto-Electronic Technology (China)
Lei Fu, Beijing Institute of Opto-Electronic Technology (China)
Hao Wang, Beijing Institute of Opto-Electronic Technology (China)


Published in SPIE Proceedings Vol. 4222:
Process Control and Inspection for Industry
Shulian Zhang; Wei Gao, Editor(s)

© SPIE. Terms of Use
Back to Top