Share Email Print
cover

Proceedings Paper

New hierarchical approach to pattern matching for industrial applications
Author(s): Markus Brandner; Axel J. Pinz; Wolfgang Poelzleitner
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this paper a new hierarchical structure for fast, robust geometry-based pattern matching is proposed. As opposed to many pattern matching systems reported in the literature we use a structure comprising a number of alternating feature processing and constraint layers. Feature extraction accuracy ranges from coarse at the bottom of the structure to a fine level at the top. A 2D quasi-affine matching system based on the proposed structure has been implemented. Experiments show the reduction in the amount of image data being processed in every layer of the structure as a consequence of applying constraints to the data between two adjacent feature extraction layers. The structure is able to utilize scalable feature extraction algorithms as well as the incorporation of a priori knowledge into the feature extraction.

Paper Details

Date Published: 11 October 2000
PDF: 12 pages
Proc. SPIE 4197, Intelligent Robots and Computer Vision XIX: Algorithms, Techniques, and Active Vision, (11 October 2000); doi: 10.1117/12.403771
Show Author Affiliations
Markus Brandner, Graz Univ. of Technology (Austria)
Axel J. Pinz, Graz Univ. of Technology (Austria)
Wolfgang Poelzleitner, Sensotech Research and Development GmbH (Austria)


Published in SPIE Proceedings Vol. 4197:
Intelligent Robots and Computer Vision XIX: Algorithms, Techniques, and Active Vision
David P. Casasent, Editor(s)

© SPIE. Terms of Use
Back to Top