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Proceedings Paper

Intercomparison of regular spectral transmittance and reflectance measurements with FTIR- and monochromator-based spectrophotometers
Author(s): Simon G. Kaplan; Leonard M. Hanssen; Edward A. Early; Maria E. Nadal
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Paper Abstract

We have performed regular spectral transmittance and reflectance measurements over the 1 (mu) m to 2.5 (mu) m wavelength region on several different types of materials using three different spectrophotometer systems. Two of the systems employ grating-based monochromators and InGaAs photovoltaic detectors. The beam at the sample position is nearly collimated. The other system uses an FTIR (Fourier Transform Infrared) spectrophometer as a source and a diffuse Au-coated integrating sphere with a photoconductive HgCdTe detector. In this system, the sample is placed at the focus of an f/6 converging beam. Measurements are performed on transmissive materials as well as either highly reflective or absorptive mirrors and the results are compared, taking into account any differences in beam geometry and polarization among the different systems.

Paper Details

Date Published: 11 October 2000
PDF: 9 pages
Proc. SPIE 4103, Optical Diagnostic Methods for Inorganic Materials II, (11 October 2000); doi: 10.1117/12.403570
Show Author Affiliations
Simon G. Kaplan, National Institute of Standards and Technology (United States)
Leonard M. Hanssen, National Institute of Standards and Technology (United States)
Edward A. Early, National Institute of Standards and Technology (United States)
Maria E. Nadal, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 4103:
Optical Diagnostic Methods for Inorganic Materials II
Leonard M. Hanssen, Editor(s)

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