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Proceedings Paper

Choice of modulation parameters in photothermal-modulation laser diode interferometer
Author(s): Xianzhao Wang; Hongbin Lu; Xuefeng Wang; Danyang Yu; Feng Qian; Gaoting Chen; Zujie Fang
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Paper Abstract

In the laser diode interferometer with a photothermal wavelength modulation which is used for optical fine measurement, intensity fluctuations of light source cause measurement errors through the fluctuations decrease greatly as compared with the injection current modulation of wavelength. In this paper, we investigated the effect of photothermal modulation parameters of wavelength on the intensity fluctuations of light source. Choosing appropriate photothermal-modulation parameters, we measured microdisplacements of object with a high measurement accuracy.

Paper Details

Date Published: 6 October 2000
PDF: 5 pages
Proc. SPIE 4231, Advanced Optical Manufacturing and Testing Technology 2000, (6 October 2000); doi: 10.1117/12.402835
Show Author Affiliations
Xianzhao Wang, Shanghai Institute of Optics and Fine Mechanics (China)
Hongbin Lu, Shanghai Institute of Optics and Fine Mechanics (China)
Xuefeng Wang, Shanghai Institute of Optics and Fine Mechanics (China)
Danyang Yu, Shanghai Univ. (China)
Feng Qian, Shanghai Institute of Optics and Fine Mechanics (China)
Gaoting Chen, Shanghai Institute of Optics and Fine Mechanics (China)
Zujie Fang, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 4231:
Advanced Optical Manufacturing and Testing Technology 2000
Li Yang; Harvey M. Pollicove; Qiming Xin; James C. Wyant, Editor(s)

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