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Proceedings Paper

Measurement of residual stress distribution of xenon flashlamp tube
Author(s): Mu Zhou; Zhe Chen; Yongming Hu; Zhou Meng; Ming Ni
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Paper Abstract

A measuring method of residual stress distribution in xenon flashlamp tube is described in this paper. The stress birefringence of both front surface and back surface of the xenon flashlamp tube could be obtained quantitatively. In our experiments, the smallest measuring optical path difference is 0.2 nm. The resolution power of optical path difference of our system could be 0.01 nm. Preliminary measuring results indicate that this system could justify the measuring precision requirement of stress birefringence of xenon flashlamp tube. Because of the simple operation of this measuring system, this system is convenient to be automated at little cost of precision, which is a very important merit when there are mass measurements to do.

Paper Details

Date Published: 6 October 2000
PDF: 8 pages
Proc. SPIE 4231, Advanced Optical Manufacturing and Testing Technology 2000, (6 October 2000); doi: 10.1117/12.402823
Show Author Affiliations
Mu Zhou, National Univ. of Defense Technology (China)
Zhe Chen, National Univ. of Defense Technology (China)
Yongming Hu, National Univ. of Defense Technology (China)
Zhou Meng, National Univ. of Defense Technology (China)
Ming Ni, National Univ. of Defense Technology (China)


Published in SPIE Proceedings Vol. 4231:
Advanced Optical Manufacturing and Testing Technology 2000
Li Yang; Harvey M. Pollicove; Qiming Xin; James C. Wyant, Editor(s)

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