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Proceedings Paper

Automatic refractometer for measuring refractive indices of solid material over a wide range of wavelengths
Author(s): Lei Wang; Kezhe Zheng; Jiangang Wang
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Paper Abstract

A description is given of a refractometer on which refractive indices of solid materials have been measured from 0.4 micrometer to 12 micrometer. The computer controls the procedure of measurement and automatic measuring is achieved. Infrared light, visual light and grating monochromatic provide the system with continual monochromatic wave. Different detector and different method of measurement are used at different range of wavelengths. Oscillating slit technique is used to improve measuring accuracy. Refractive index values are obtained with an estimate uncertainty of 5 x 10-6 in visual waveband and 2 x 10-4 in infrared waveband. Values of refractive indices for germanium are given in the end.

Paper Details

Date Published: 6 October 2000
PDF: 5 pages
Proc. SPIE 4231, Advanced Optical Manufacturing and Testing Technology 2000, (6 October 2000); doi: 10.1117/12.402821
Show Author Affiliations
Lei Wang, Xi'an Institute of Applied Optics (China)
Kezhe Zheng, Xi'an Institute of Applied Optics (China)
Jiangang Wang, Xi'an Institute of Applied Optics (China)


Published in SPIE Proceedings Vol. 4231:
Advanced Optical Manufacturing and Testing Technology 2000
Li Yang; Harvey M. Pollicove; Qiming Xin; James C. Wyant, Editor(s)

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