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Proceedings Paper

Phase-shifting scatterplate interferometer
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Paper Abstract

The advantages of common path interferometers for reducing effects of vibrations are well known. A scatterplate interferometer is one common-path interferometer that is well suited for the testing of large concave mirrors, however due to the common path characteristics it is difficult to perform phase-shifting. This paper describes a phase-shifting scatterplate interferometer where the phase-shifting is achieved by making use of the polarization characteristics of a birefringent scatterplate. The major advantage of this design is that it does not require any optical components to be placed near the surface under test. The theory of the interferometer is presented and experimental results are shown.

Paper Details

Date Published: 6 October 2000
PDF: 8 pages
Proc. SPIE 4231, Advanced Optical Manufacturing and Testing Technology 2000, (6 October 2000); doi: 10.1117/12.402819
Show Author Affiliations
Michael B. North Morris, Optical Sciences Ctr./Univ. of Arizona (United States)
James C. Wyant, Optical Sciences Ctr./Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 4231:
Advanced Optical Manufacturing and Testing Technology 2000
Li Yang; Harvey M. Pollicove; Qiming Xin; James C. Wyant, Editor(s)

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