Share Email Print
cover

Proceedings Paper

Relationship between inside defects and optical properties of CVDZnS
Author(s): Huaizhi Yu; Ruifeng Song; Chengsong Huo; Jianping Liu; Wancai Huang; Hongchun Shi
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Experiment methods such as X-ray diffraction, ICP-AES, TEM are adopted to study the relationship between optical properties and inside defects of CVDZnS samples which deposit at different experiment conditions. Through our studies, we draw the conclusion that there inside the material exists a kind of Zn-H associated particle which functioned as optical scatter centers. These scatter centers will lower the transmittance of CVDZnS both in the visible and the IR spectral regions. However, these Zn-H associated particles can be diminished through Hot Isostatic Pressing processing, and after the processing the transmittance of ZnS will substantially improved, especially in the visible spectral region.

Paper Details

Date Published: 6 October 2000
PDF: 7 pages
Proc. SPIE 4231, Advanced Optical Manufacturing and Testing Technology 2000, (6 October 2000); doi: 10.1117/12.402804
Show Author Affiliations
Huaizhi Yu, General Research Institute of Non-ferrous Metals (China)
Ruifeng Song, General Research Institute of Non-ferrous Metals (China)
Chengsong Huo, General Research Institute of Non-ferrous Metals (China)
Jianping Liu, General Research Institute of Non-ferrous Metals (China)
Wancai Huang, General Research Institute of Non-ferrous Metals (China)
Hongchun Shi, General Research Institute of Non-ferrous Metals (China)


Published in SPIE Proceedings Vol. 4231:
Advanced Optical Manufacturing and Testing Technology 2000
Li Yang; Harvey M. Pollicove; Qiming Xin; James C. Wyant, Editor(s)

© SPIE. Terms of Use
Back to Top