Share Email Print
cover

Proceedings Paper

Absolute phase measurement of linear integer unconcerned phase maps
Author(s): Jingang Zhong
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

A procedure for the measurement of absolute phase values is presented and is used to measure the 3D shape of object with discontinuous height steps. This procedure is based on the linear integer unconcerned phase-maps. Linear integer unconcerned phase-maps are obtained by changing the projecting angle of grating or grating orientation. Experimental results for two kinds of projection optics are presented that demonstrate the validity of the principle.

Paper Details

Date Published: 9 October 2000
PDF: 5 pages
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402651
Show Author Affiliations
Jingang Zhong, Jinan Univ. (China)


Published in SPIE Proceedings Vol. 4221:
Optical Measurement and Nondestructive Testing: Techniques and Applications
FeiJun Song; Frank Chen; Michael Y.Y. Hung; H.M. Shang, Editor(s)

© SPIE. Terms of Use
Back to Top