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Proceedings Paper

Application of real-time holographic method to the microcrack nucleation process study
Author(s): Bingheng Xiong; Zhengrong Wang; Xiaoxu Lu; Liyun Zhong; Yongan Zhang; Canlin She; Zhaoyong Xu; Runhai Yang; Jinming Zhao; Peilin Li; Peizhong Hua
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Paper Abstract

The fracture process of uniformity solid is simulated by a series of transparent specimen in this study in order to discover relationships between the micro-crack nucleation process and the surrounding stress field. A real-time holographic interferometry is used to record the stress fields and its variations in the specimen while the wave-forms of ultrasonic emission stimulated by the micro-cracks are recorded by a transient automatic wave- form recorder to determine the time, location and intensity of the micro-cracks. The development process of fracture can be visualized clearly by this real-time holographic interferometry. The initial experimental study has brought some phenomena worthy of study. This method provides a powerful new approach for experimental mechanics and seismological research.

Paper Details

Date Published: 9 October 2000
PDF: 5 pages
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402649
Show Author Affiliations
Bingheng Xiong, Kunming Univ. of Science and Technology (China)
Zhengrong Wang, Kunming Univ. of Science and Technology (China)
Xiaoxu Lu, Kunming Univ. of Science and Technology (China)
Liyun Zhong, Kunming Univ. of Science and Technology (China)
Yongan Zhang, Kunming Univ. of Science and Technology (China)
Canlin She, Kunming Univ. of Science and Technology (China)
Zhaoyong Xu, Seismological Bureau of Yunnan Province (China)
Runhai Yang, Seismological Bureau of Yunnan Province (China)
Jinming Zhao, Seismological Bureau of Yunnan Province (China)
Peilin Li, Seismological Bureau of Yunnan Province (China)
Peizhong Hua, Seismological Bureau of Yunnan Province (China)


Published in SPIE Proceedings Vol. 4221:
Optical Measurement and Nondestructive Testing: Techniques and Applications
FeiJun Song; Frank Chen; Michael Y.Y. Hung; H.M. Shang, Editor(s)

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