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Proceedings Paper

Application of wavelet de-noise in digital speckle correlation method
Author(s): Xuefeng Yao; Guan-chang Jin; Wu Zhen
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Paper Abstract

De-noise effects of wavelet analysis technique on Digital speckle correlation method (DSCM) are described in this paper. The principle of wavelet de-noise in digital speckle correlation is shown and the related algorithm structure is given. A series of DSCM experimental results, such as zero displacement, rigid body movement and 3-point-bending deformation, are handled. These results reveal that Wavelet analysis technique has better de- noise effect in the DSCM and the measure precision can reach to 0.01-0.005 pixel. This advanced DSCM provides a precision deformation measurement tool in optical metrology.

Paper Details

Date Published: 9 October 2000
PDF: 5 pages
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402643
Show Author Affiliations
Xuefeng Yao, Tsinghua Univ. (China)
Guan-chang Jin, Tsinghua Univ. (China)
Wu Zhen, Tsinghua Univ. (China)


Published in SPIE Proceedings Vol. 4221:
Optical Measurement and Nondestructive Testing: Techniques and Applications
FeiJun Song; Frank Chen; Michael Y.Y. Hung; H.M. Shang, Editor(s)

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