Share Email Print
cover

Proceedings Paper

Image-based recognition of the chip shape
Author(s): Xianli Liu; Guoliang Zhao; Lin Lin; An Meng
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

According to the profile characteristics of the extracted chip form and the number of nodes between profile and * line which have the same gravity, chip species are discerned. The chip types near the critical joint are judged exactly through the standard tolerance of all direction nodes. It was tested to have a high accordant rate.

Paper Details

Date Published: 9 October 2000
PDF: 4 pages
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402626
Show Author Affiliations
Xianli Liu, Harbin Engineering Univ. (China)
Guoliang Zhao, Harbin Engineering Univ. (China)
Lin Lin, Harbin Univ. of Science and Technology (China)
An Meng, Harbin Univ. of Science and Technology (China)


Published in SPIE Proceedings Vol. 4221:
Optical Measurement and Nondestructive Testing: Techniques and Applications
FeiJun Song; Frank Chen; Michael Y.Y. Hung; H.M. Shang, Editor(s)

© SPIE. Terms of Use
Back to Top