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Proceedings Paper

Correlative stitching technique for measuring flatness
Author(s): Yingjie Yu
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Paper Abstract

In flatness measuring by correlative stitching technique, a bigger scale's measurement can be realized by the system witha smaller measurement caliber. At the same time, high measurement precision, high spatial resolution and low price can be maintained. In this technique, mode building and solving are especially important. Aiming at some problems in common mode building and solving, the paper presents a new solving method. The iterative least-squares technique is applied in the method and it considers not only the information in height, but also the influence of the parameters in other directions which are usually predigested in common modes. By this solving method, the demand for rail of systems is decreased. Some simitations are done to testify the presented method.

Paper Details

Date Published: 9 October 2000
PDF: 5 pages
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402604
Show Author Affiliations
Yingjie Yu, Shanghai Univ. (China)


Published in SPIE Proceedings Vol. 4221:
Optical Measurement and Nondestructive Testing: Techniques and Applications
FeiJun Song; Frank Chen; Michael Y.Y. Hung; H.M. Shang, Editor(s)

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