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Proceedings Paper

New application of holography and interferometry in temperature sensing
Author(s): Jing Zhou; Henry F. Taylor
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Paper Abstract

A new application of holography and interferometry in temperature sensing is proposed in this paper. Using holographic technique and electron lithography, a grating can be made in a fiber's end. This structure can be used to test the temperature change. By examining the interfering pattern of diffract lights of the grating, the temperature change can be calculated. If using the work wavelength of 1.55micrometers , the temperature testing range can theoretically be 1179 degree(s)C.

Paper Details

Date Published: 9 October 2000
PDF: 3 pages
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402577
Show Author Affiliations
Jing Zhou, Beijing Normal Univ. (China)
Henry F. Taylor, Texas A&M Univ. (United States)


Published in SPIE Proceedings Vol. 4221:
Optical Measurement and Nondestructive Testing: Techniques and Applications
FeiJun Song; Frank Chen; Michael Y.Y. Hung; H.M. Shang, Editor(s)

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