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Proceedings Paper

Selection of pattern in slit diffraction measurement and its influence on measurement accuracy
Author(s): Fuping Liang
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Paper Abstract

The serial parameters such as slit width, wire diameters and plate thickness can be measured by application of diffraction, and it can be derived to measure the variables of interval, displacement, strain, section and the others. The field distribution of slit diffraction are investigated, and the extreme values of slit diffraction are given step-by-step approach with computer. The influence of selecting the pattern and the level of the comparator for video frequency output of CCD/CCPD upon measurement accuracy are analyzed.

Paper Details

Date Published: 9 October 2000
PDF: 5 pages
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402573
Show Author Affiliations
Fuping Liang, Beijing Institute of Machinery (China)

Published in SPIE Proceedings Vol. 4221:
Optical Measurement and Nondestructive Testing: Techniques and Applications
FeiJun Song; Frank Chen; Michael Y.Y. Hung; H.M. Shang, Editor(s)

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