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Proceedings Paper

Testing of a semiconductor laser integrated system with CCD camera
Author(s): Junfeng Lu; JingJuan Zhang; Wenxi Liang; Rui Liao
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Paper Abstract

A diffractive optical element is designed and fabricated to improve the characteristics of the divergence angles of a high- power semiconductor laser. In this paper, the performance of an infrared illuminating system integrated by the diffractive optical element and a semiconductor laser is tested. The images of the infrared illuminating system are collected with the CCD camera and processed by a laser-beam analyzer. In the same time, the picture of three dimensions intensity distribution and the curve of the intensity distribution of any section of the laser beam can be shown clearly. With various characteristics of the laser beam being analyzed, the data of the visual angle in the system is consistent with the design requirement excellently. The experimental result proves that the diffractive optical element obviously ameliorates the divergence angle of the semiconductor laser. It can make the ellipticities of the illuminating faculas less than 1.5 in a propagating distance from 40 meters to 100 meters. This measuremental method can not only present the quantitative analysis, but also be taken a real-time monitoring control.

Paper Details

Date Published: 9 October 2000
PDF: 5 pages
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402564
Show Author Affiliations
Junfeng Lu, Univ. of Science and Technology of China (China)
JingJuan Zhang, Univ. of Science and Technology of China (China)
Wenxi Liang, Univ. of Science and Technology of China (China)
Rui Liao, Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 4221:
Optical Measurement and Nondestructive Testing: Techniques and Applications
FeiJun Song; Frank Chen; Michael Y.Y. Hung; H.M. Shang, Editor(s)

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