Proceedings Paper
Rapid inspection method of an O-E receiver| Format | Member Price | Non-Member Price |
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Paper Abstract
For the first time, the rapid inspection method of an O-E receiver based on second-harmonic is proposed for measuring 1.064 micrometers and 0.91 micrometers laser pulse with duration of about 10nm. By comparing the two waveforms from a pulse of laser, we achieve more than 0.6% relative error of pulse-width. The opto- electronic receive have inspected come into use for measuring laser waveform. The measurement uncertainties of ratio of integration area to peak voltage of the laser waveform is 0.6%. It is shown that the ratio is an important parameter for evaluating the accuracy of laser waveform, in contrast, the transient time invariance and linearity of opto-electronic detector is verified.
Paper Details
Date Published: 9 October 2000
PDF: 4 pages
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402560
Published in SPIE Proceedings Vol. 4221:
Optical Measurement and Nondestructive Testing: Techniques and Applications
FeiJun Song; Frank Chen; Michael Y.Y. Hung; H.M. Shang, Editor(s)
PDF: 4 pages
Proc. SPIE 4221, Optical Measurement and Nondestructive Testing: Techniques and Applications, (9 October 2000); doi: 10.1117/12.402560
Show Author Affiliations
Yao Nan, Xi'an Institute of Applied Optics (China)
Linmiao Xu, Xi'an Institute of Applied Optics (China)
Linmiao Xu, Xi'an Institute of Applied Optics (China)
Xuanjun Jia, Xi'an Institute of Applied Optics (China)
Zhaojing Yang, Xi'an Institute of Applied Optics (China)
Zhaojing Yang, Xi'an Institute of Applied Optics (China)
Published in SPIE Proceedings Vol. 4221:
Optical Measurement and Nondestructive Testing: Techniques and Applications
FeiJun Song; Frank Chen; Michael Y.Y. Hung; H.M. Shang, Editor(s)
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