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Proceedings Paper

Improvement of tapping-mode scanning near-field optical microscope
Author(s): Wenjiang Zhuo; Qin Li; Jialin Sun; Jianhua Xu; Jun Zhao; Jihua Guo
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Paper Abstract

The commercial crystal tuning fork glued with an optical fiber probe is used as the sensitive detecting element for the tapping-mode scanning near-field optical microscopy. Firstly, the single-mode optical fiber is etched down to a small diameter to decrease the burden of the tuning fork. Secondary, the fiber is etched for the second time to form the sharp tip with large cone angle. Thirdly, the fiber probe, with nanometric tip and high light throughput, is glued to tuning fork by Cyanoacrylate Adhesive. The measured quality factor, Q, of the tuning fork/optical fiber probe assembly prepared in this way is higher than 300. The optical signal is modulated to the frequency of the tuning fork by optical fiber probe as it is detecting the topography of sample. The high-resolution of the tapping- mode detector is proved by imaging the topography of the grating and biological cell.

Paper Details

Date Published: 5 October 2000
PDF: 4 pages
Proc. SPIE 4223, Instruments for Optics and Optoelectronic Inspection and Control, (5 October 2000); doi: 10.1117/12.401792
Show Author Affiliations
Wenjiang Zhuo, Tsinghua Univ. (China)
Qin Li, Tsinghua Univ. (China)
Jialin Sun, Tsinghua Univ. (China)
Jianhua Xu, Tsinghua Univ. (China)
Jun Zhao, Tsinghua Univ. (China)
Jihua Guo, Tsinghua Univ. (China)


Published in SPIE Proceedings Vol. 4223:
Instruments for Optics and Optoelectronic Inspection and Control
Guang Hui Wei; Sheng Liu, Editor(s)

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