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Proceedings Paper

Sensitive intracavity photoacoustic spectrometer based on CO2 waveguide laser
Author(s): Shaocheng Li; Qingxu Yu; Zhibin Chen; Junxiu Lin
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Paper Abstract

Photoacoustic spectroscopy (PAS) is a promising spectroscopic technology due to its intrinsically high sensitivity, large dynamic range and comparatively simple experimental arrangement. In this paper a photoacoustic interactive configuration is presented. The system consists of three main parts: CO2 waveguide laser, a photoacoustic cell and electronic measurement system. The resonant photoacoustic cell excited in its first longitudinal mode is placed inside the optical cavity of the CO2 waveguide laser. Due to the high intracavity power the photoacoustic signal is enhanced almost tow orders of magnitude compared with the extracavity configuration. The optimum system design was found by numerical simulation of the acoustic properties of various cell geometries. An open- resonator model is developed and analyzed in detail. The characteristics of the system we have predicted using the theory match the experimental results very well. Many methods such as adding iris before the spectrometer, adjusting the position of chopper are used to modify the configuration of the system, which proved to be helpful to get better quality. A computer program based on spectroscopic tack technique system improves the long-term stability and measurement accuracy. Finally this PAS system is applied to various trace gas analysis of plant successfully and a detection sensitivity of ppt level for C2H4 is reached.

Paper Details

Date Published: 5 October 2000
PDF: 4 pages
Proc. SPIE 4223, Instruments for Optics and Optoelectronic Inspection and Control, (5 October 2000); doi: 10.1117/12.401777
Show Author Affiliations
Shaocheng Li, Dalian Univ. of Technology (China)
Qingxu Yu, Dalian Univ. of Technology (China)
Zhibin Chen, Dalian Univ. of Technology (China)
Junxiu Lin, Dalian Univ. of Technology (China)


Published in SPIE Proceedings Vol. 4223:
Instruments for Optics and Optoelectronic Inspection and Control
Guang Hui Wei; Sheng Liu, Editor(s)

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