Share Email Print
cover

Proceedings Paper

Assessment of sensitivity advances in near-field Raman spectroscopy
Author(s): Chris A. Michaels; Claire E.J. Dentinger; Lee J. Richter; D. Bruce Chase; Richard R. Cavanagh; Stephan J. Stranick
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Near-field Raman spectroscopy can be used to obtain images with both chemical specificity and the subwavelength spatial resolution of near-field scanning optical microscopy. In the absence of signal intensification factors, such as `surface enhancement' or electronic resonance in the specimen, Raman scattering suffers from a small cross section ((sigma) equals 10-28 cm2 to 10-31 cm2). Since most reports of Raman-NSOM to date involve exploitation of a specimen-specific intensification, an assessment of the general applicability of Raman-NSOM to a wider variety of `un-enhanced' samples is of great interest. We report here on several approaches to increasing the sensitivity of near- field Raman spectroscopy that do not rely on specimen properties. The use of chemically etched aperture probes as an illumination source has been investigated and compared to probes fabricated by the traditional heat and pull method.

Paper Details

Date Published: 29 September 2000
PDF: 8 pages
Proc. SPIE 4098, Optical Devices and Diagnostics in Materials Science, (29 September 2000); doi: 10.1117/12.401636
Show Author Affiliations
Chris A. Michaels, National Institute of Standards and Technology (United States)
Claire E.J. Dentinger, Zyomyx, Inc. (United States)
Lee J. Richter, National Institute of Standards and Technology (United States)
D. Bruce Chase, DuPont Central Research and Development (United States)
Richard R. Cavanagh, National Institute of Standards and Technology (United States)
Stephan J. Stranick, National Institute of Standards and Technology (United States)


Published in SPIE Proceedings Vol. 4098:
Optical Devices and Diagnostics in Materials Science
David L. Andrews; David L. Andrews; Toshimitsu Asakura; Suganda Jutamulia; Wiley P. Kirk; Max G. Lagally; Ravindra B. Lal; James D. Trolinger, Editor(s)

© SPIE. Terms of Use
Back to Top