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Proceedings Paper

Scanning near-field optical microscope: systems designs, performance specifications, and standardization schemes
Author(s): Tuan-Kay Lim
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Paper Abstract

In recent years, there have been intense efforts in the study of the physical principles and applications of the scanning near-field optical microscope. Extensive theoretical analyses, numerical simulations, and experimental investigations have been conducted. It is demonstrated that image resolution and contrast depend not only on the aperture size of the probe and the reflection/transmission of the sample, but also on other parameters and experimental conditions. Accordingly, appropriate characterizations of image resolution and systems performance specifications are needed to enable the construction of more reliable and reproducible systems as well as inter-laboratory comparison. In this paper, recent advances in the systems design concepts for different applications will be reviewed, and possible standardization schemes for the characterization of image resolution and the specification of system performance will be proposed.

Paper Details

Date Published: 29 September 2000
PDF: 4 pages
Proc. SPIE 4098, Optical Devices and Diagnostics in Materials Science, (29 September 2000); doi: 10.1117/12.401618
Show Author Affiliations
Tuan-Kay Lim, Nanyang Technological Univ. (Singapore)


Published in SPIE Proceedings Vol. 4098:
Optical Devices and Diagnostics in Materials Science
David L. Andrews; Toshimitsu Asakura; Suganda Jutamulia; Wiley P. Kirk; Max G. Lagally; Ravindra B. Lal; James D. Trolinger; David L. Andrews, Editor(s)

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