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Proceedings Paper

Determination of geometric properties of SNOM tips by means of far-field evaluation
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Paper Abstract

Scanning near field optical microscopes provide access to highly resolved optical and topographical surface properties. The resolutions that can be achieved are better than 100 nm. However, the quality of the optical fiber tip is of decisive importance. Because the production process of pulled and coated glass fiber tips is still highly empirical and error-prone, a technique would be useful to determine the tips' quality before they are shipped to the user or mounted in the microscope.

Paper Details

Date Published: 29 September 2000
PDF: 11 pages
Proc. SPIE 4098, Optical Devices and Diagnostics in Materials Science, (29 September 2000); doi: 10.1117/12.401617
Show Author Affiliations
Soenke Seebacher, Bremen Institut fuer Angewandte Strahltechnik (Germany)
Wolfgang Osten, Bremen Institut fuer Angewandte Strahltechnik (Germany)
Werner P. O. Jueptner, Bremen Institut fuer Angewandte Strahltechnik (Germany)
Vadim P. Veiko, Institute of Fine Mechanics and Optics (Russia)
Nikolay B. Voznesensky, Institute of Fine Mechanics and Optics (Russia)


Published in SPIE Proceedings Vol. 4098:
Optical Devices and Diagnostics in Materials Science
David L. Andrews; Toshimitsu Asakura; Suganda Jutamulia; Wiley P. Kirk; Max G. Lagally; Ravindra B. Lal; James D. Trolinger; David L. Andrews, Editor(s)

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