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Proceedings Paper

Sharpened carbon nanotube probes
Author(s): Katerina Moloni; Amit Lal; Max G. Lagally
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Paper Abstract

Carbon nanotube tips (CNT) offer many advantages over the standard SFM probes, namely high aspect ratio, high resolution, durability, minimal tip or sample damage and, perhaps most important, tailoring. We demonstrate here the value of CNT as probes for surface metrology. Their high- aspect ratio enables profiling morphologies that are inaccessible to conventional probes. We report method for controlling the end-form of a nanotube bundle (mounted on a Si tip) so that a single nanotube protrudes from it. We did not observe any tip or sample wear over time with CNT probes, contrary to results with conventional probes. We also demonstrate that a combination of tuning forks and nanotubes can be used as probes for SPM.

Paper Details

Date Published: 29 September 2000
PDF: 8 pages
Proc. SPIE 4098, Optical Devices and Diagnostics in Materials Science, (29 September 2000); doi: 10.1117/12.401613
Show Author Affiliations
Katerina Moloni, Piezomax Technologies, Inc. (United States)
Amit Lal, Univ. of Wisconsin/Madison (United States)
Max G. Lagally, Univ. of Wisconsin/Madison (United States)


Published in SPIE Proceedings Vol. 4098:
Optical Devices and Diagnostics in Materials Science
David L. Andrews; David L. Andrews; Toshimitsu Asakura; Suganda Jutamulia; Wiley P. Kirk; Max G. Lagally; Ravindra B. Lal; James D. Trolinger, Editor(s)

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