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Proceedings Paper

Status of contamination control and related standards
Author(s): Eugene N. Borson
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Paper Abstract

Manu U.S. government standards are being replaced with nongovernmental standards, both national and international. The use of international standards is increasing as the levels of international trade increase. Contamination control is critical for many industries and has resulted in greater numbers of national and international standards on this subject with more standards in development. Some standards relate to specific industries, and others are applicable to many industries. This paper review the status of the U.S., European, and ISO (International Organization for Standardization) that are of interest to optical systems, especially those related to space systems.. Items taht are discussed include the following: The revision to MIL-STD-1246 (Product Cleanliness Levels and Contamination Control Program) will be published by the IEST (Institute of Environmental Sciences and Technology) as a nongovernmental standard; ISO 14644-1 and 14644-2 will replace FED-STD-209 (Airborne Particle Cleanliness Classes in Cleanroom and Clean Zones); ISO 15388 (Space Systems - Contamination and cleanliness Control) is under development; IEST-RP-CC016 (The Rate of Deposition of Nonvolatile Residue in Cleanrooms) is now being revised; ASTM E 595 (outgassing screening test) is used internationally; the ASTM E 1559 outgassing test has been revised; and ASTM E 490 (Standard Solar Constant and Zero Air Mass Solar Spectral Irradiance Tables) has been revised. Other standards from ASTM, IEST, ECSS (European Cooperation for Space Standardization), and ISO are discussed. Lists of standards, points of contact, and information available on the Internet are included.

Paper Details

Date Published: 20 September 2000
PDF: 11 pages
Proc. SPIE 4096, Optical Systems Contamination and Degradation II: Effects, Measurements, and Control, (20 September 2000); doi: 10.1117/12.400838
Show Author Affiliations
Eugene N. Borson, Consultant (United States)

Published in SPIE Proceedings Vol. 4096:
Optical Systems Contamination and Degradation II: Effects, Measurements, and Control
Philip T. C. Chen; O. Manuel Uy, Editor(s)

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