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Proceedings Paper

Automated analysis of data mark microstructure of various media in the optical disk industry
Author(s): Candi S. Cook; Donald A. Chernoff; David L. Burkhead
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Paper Abstract

We have developed a new technique for measuring pit geometry, track pitch, jitter and wobble on compact discs (CD) and digital versatile discs. This method uses direct physical inspection with a Atomic Force Microscope. The images are analyzed by our automated method and yield statistically robust results, so that process windows can be determined. In both types of media we report a variety of statistical parameters including mean and standard deviation and create trend charts and other graphs. In addition to the media previously mentioned we demonstrate imaging the data marks of a written CD-RW using surface potential.

Paper Details

Date Published: 18 September 2000
PDF: 10 pages
Proc. SPIE 4090, Optical Data Storage 2000, (18 September 2000); doi: 10.1117/12.399345
Show Author Affiliations
Candi S. Cook, Advanced Surface Microscopy, Inc. (United States)
Donald A. Chernoff, Advanced Surface Microscopy, Inc. (United States)
David L. Burkhead, Advanced Surface Microscopy, Inc. (United States)

Published in SPIE Proceedings Vol. 4090:
Optical Data Storage 2000
Douglas G. Stinson; Ryuichi Katayama, Editor(s)

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