Share Email Print

Proceedings Paper

Optical shape measurement technology: past, present, and future
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

This paper provides an overview of some of the main competing optical technologies on which future commercial wholefield shape measurement systems are likely to be based. The methods range from those based on pointwise techniques, such as laser triangulation and laser radar, to wholefield techniques such as projected fringes, Gray code methods and white light interferometry. Data analysis procedures including phase shifting and phase unwrapping are also described. The main error sources limiting the performance of the techniques are presented, and their current and prospective performances are assessed in view of recent developments in components such as computers, solid state cameras, and semiconductor lasers.

Paper Details

Date Published: 31 August 2000
PDF: 12 pages
Proc. SPIE 4076, Optical Diagnostics for Industrial Applications, (31 August 2000); doi: 10.1117/12.397944
Show Author Affiliations
Jonathan Mark Huntley, Loughborough Univ. (United Kingdom)

Published in SPIE Proceedings Vol. 4076:
Optical Diagnostics for Industrial Applications
Neil A. Halliwell, Editor(s)

© SPIE. Terms of Use
Back to Top