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Proceedings Paper

Local intensity tests for optimal detectability
Author(s): LiKang Yen; Sashidhar Bhikkaji; Jose C. Principe
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Paper Abstract

This paper develops a method to model the two parameter Constant False Alarm Rate (CFAR) detector as an intensity test. For optimality we show that the shape of the stencil should be matched to the radial intensity profile of the target. Using principal component analysis (PCA) we show experimentally that the first gamma kernel is a good approximation to the target profile, which explains the good results of the (gamma) -CFAR detector, and may lead to configurable stencils for better detectability.

Paper Details

Date Published: 24 August 2000
PDF: 12 pages
Proc. SPIE 4053, Algorithms for Synthetic Aperture Radar Imagery VII, (24 August 2000); doi: 10.1117/12.396341
Show Author Affiliations
LiKang Yen, Univ. of Florida (United States)
Sashidhar Bhikkaji, Univ. of Florida (United States)
Jose C. Principe, Univ. of Florida (United States)

Published in SPIE Proceedings Vol. 4053:
Algorithms for Synthetic Aperture Radar Imagery VII
Edmund G. Zelnio, Editor(s)

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