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Proceedings Paper

Experimental study of laser bistatic scattering from random deeply rough surface and backscattering enhancemant
Author(s): Zhensen Wu; Kun Song; Liyan Qi
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Paper Abstract

The laser bistatic scattering from some deeply rough plane samples are measured by using of the automated scattering measurement system. We observe the backscattering enhancement, which is confined to a narrow cone around the antispecular direction, and discuss the influences of roughness and dielectric properties on them.

Paper Details

Date Published: 24 July 2000
PDF: 6 pages
Proc. SPIE 4029, Targets and Backgrounds VI: Characterization, Visualization, and the Detection Process, (24 July 2000); doi: 10.1117/12.392550
Show Author Affiliations
Zhensen Wu, Xidian Univ. (China)
Kun Song, Xidian Univ. (China)
Liyan Qi, Xidian Univ. (China)


Published in SPIE Proceedings Vol. 4029:
Targets and Backgrounds VI: Characterization, Visualization, and the Detection Process
Wendell R. Watkins; Dieter Clement; William R. Reynolds, Editor(s)

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