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Proceedings Paper

Optimal dithering of focal plane arrays in passive millimeter-wave imaging
Author(s): Yun Gao; Stanley J. Reeves
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Paper Abstract

Passive millimeter-wave imagery has tremendous potential for imaging in adverse conditions. However, poor resolution and long acquisition times pose serious limitations to this potential. Therefore, an important issue is the optimization of the sampling pattern. Ordinarily, a focal plane sensor array has sensors placed in a rectangular grid pattern at sub-Nyquist density, and the array must be dithered to sample the image plane at the Nyquist density in each dimension. However, the Nyquist density oversamples the image due to the usually circular support of the diffraction-limited image spectrum. We develop an efficient algorithm for optimizing the dithering pattern so that the image can be reconstructed as reliably as possible from a periodic nonuniform set of samples, which can be obtained from a dithered rectangular-grid array. Taking into account the circular frequency support of the image, we sequentially eliminate the least informative array recursively until the minimal number of arrays remain. The resulting algorithm can be used as a tool in exploring the optimal image acquisition strategy.

Paper Details

Date Published: 20 July 2000
PDF: 10 pages
Proc. SPIE 4032, Passive Millimeter-Wave Imaging Technology IV, (20 July 2000); doi: 10.1117/12.391828
Show Author Affiliations
Yun Gao, Auburn Univ. (United States)
Stanley J. Reeves, Auburn Univ. (United States)

Published in SPIE Proceedings Vol. 4032:
Passive Millimeter-Wave Imaging Technology IV
Roger M. Smith; Roger Appleby, Editor(s)

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