Share Email Print

Proceedings Paper

Design and implementation of a new UHV threshold cathode test facility
Author(s): Ryan J. Umstattd; Donald A. Shiffler; C. A. Baca; K. J. Hendricks; Thomas A. Spencer; John W. Luginsland
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In support of cathode development at the Air Force Research Laboratory, a new ultra-high vacuum cathode test facility is being assembled to complement the existing repetition-rate test pulser. The existing test bed is a 500 kV, 100 Ohm, 1 microsecond(s) duration pulser capable of firing at up to 1 Hz. The new facility is designed to operate at lower voltages (20 - 200 kv), lower impedance (50 - 75 Ohm), and variable pulse lengths (200 - 800 ns) in a single-shot mode. This Threshold Cathode Test Facility (TCTF) will be used to generate data regarding emission turn-on field strengths, outgassing volumes and constituents, vacuum level effects, and anode effects for a variety of field-emitting and explosive- emitting cathode materials. Presented herein are the design parameters of TCTF including diagnostic capabilities and electrostatic simulations of the diode region both with and without beam current.

Paper Details

Date Published: 14 July 2000
PDF: 10 pages
Proc. SPIE 4031, Intense Microwave Pulses VII, (14 July 2000); doi: 10.1117/12.391799
Show Author Affiliations
Ryan J. Umstattd, Air Force Research Lab. (United States)
Donald A. Shiffler, Air Force Research Lab. (United States)
C. A. Baca, Air Force Research Lab. (United States)
K. J. Hendricks, Air Force Research Lab. (United States)
Thomas A. Spencer, Air Force Research Lab. (United States)
John W. Luginsland, Air Force Research Lab. (United States)

Published in SPIE Proceedings Vol. 4031:
Intense Microwave Pulses VII
Howard E. Brandt, Editor(s)

© SPIE. Terms of Use
Back to Top