Share Email Print

Proceedings Paper

Pulsed rf breakdown studies
Author(s): Lisa Laurent; George Caryotakis; Glenn P. Scheitrum; Daryl Sprehn; Neville C. Luhmann
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

A series of experiments have been conducted to investigate the critical mechanisms involved in pulsed rf breakdown. This research has examined fundamental issues such as microparticle contamination, grain boundaries, residual gas, pulse duration, field emission, and the spatial distribution of plasma during a breakdown event. The motivation of this research is to gain a clearer understanding of the processes involved in breakdown and to determine methods to increase the breakdown threshold thereby increasing the available power in high power microwave sources and accelerator components.

Paper Details

Date Published: 14 July 2000
PDF: 11 pages
Proc. SPIE 4031, Intense Microwave Pulses VII, (14 July 2000); doi: 10.1117/12.391793
Show Author Affiliations
Lisa Laurent, Stanford Linear Accelerator Ctr. (USA) and Univ. of California/Davis (United States)
George Caryotakis, Stanford Linear Accelerator Ctr. (United States)
Glenn P. Scheitrum, Stanford Linear Accelerator Ctr. (United States)
Daryl Sprehn, Stanford Linear Accelerator Ctr. (United States)
Neville C. Luhmann, Univ. of California/Davis (United States)

Published in SPIE Proceedings Vol. 4031:
Intense Microwave Pulses VII
Howard E. Brandt, Editor(s)

© SPIE. Terms of Use
Back to Top