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Proceedings Paper

Dual-band QWIP MWIR/LWIR focal plane array test results
Author(s): Arnold C. Goldberg; Theodore Fischer; Stephen W. Kennerly; Samuel C. H. Wang; Mani Sundaram; Parvez N. Uppal; Michael L. Winn; Gregory L. Milne; Mark A. Stevens
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Paper Abstract

We report on the results of laboratory and field tests on a pixel-registered, 2-color MWIR/LWIR 256 X 256 QWIP FPA with simultaneous integrating capability. The FPA studied contained stacked QWIP structures with spectral peaks at 5.1 micrometer and 9.0 micrometer. Normally incident radiation was coupled into the devices using a diffraction grating designed to operate in both spectral bands. Each pixel is connected to the read-out integrated circuit by three bumps to permit the application of separate bias levels to each QWIP stack and allow simultaneous integration of the signal current in each band. We found the FPA to have high pixel operability, well balanced response, good imaging performance, high optical fill factor, and low spectral crosstalk. We present data on measurements of the noise-equivalent temperature difference of the FPA in both bands as functions of temperature and bias. The FPA data are compared to single-pixel data taken on devices from the same wafer. We also present data on the sensitivity of this FPA to polarized light. It is found that the LWIR portion of the device is very sensitive to the direction of polarization of the incident light. The MWIR part of the device is relatively insensitive to the polarization. In addition, imagery was taken with this FPA of military targets in the field. Image fusion techniques were applied to the resulting images.

Paper Details

Date Published: 17 July 2000
PDF: 12 pages
Proc. SPIE 4028, Infrared Detectors and Focal Plane Arrays VI, (17 July 2000); doi: 10.1117/12.391740
Show Author Affiliations
Arnold C. Goldberg, Army Research Lab. (United States)
Theodore Fischer, Army Research Lab. (United States)
Stephen W. Kennerly, Army Research Lab. (United States)
Samuel C. H. Wang, Sanders, A Lockheed Martin Co. (United States)
Mani Sundaram, Sanders, A Lockheed Martin Co. (United States)
Parvez N. Uppal, Sanders, A Lockheed Martin Co. (United States)
Michael L. Winn, Sanders, A Lockheed Martin Co. (United States)
Gregory L. Milne, Lockheed Martin Electronics and Missile Systems (United States)
Mark A. Stevens, Lockheed Martin Electronics and Missile Systems (United States)

Published in SPIE Proceedings Vol. 4028:
Infrared Detectors and Focal Plane Arrays VI
Eustace L. Dereniak; Robert E. Sampson, Editor(s)

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