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Proceedings Paper

Development of a two-color projection system for the KHILS Vacuum Cold Chamber (KVACC)
Author(s): David S. Flynn; Steven Arthur Marlow; James R. Kircher; Eric W. Glattke; Robert Lee Murrer Jr.; John S. Weir
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Paper Abstract

The KHILS Vacuum Cold Chamber (KVACC) was developed to provide the capability of performing hardware-in-the-loop testing of infrared seekers requiring scenes involving cold backgrounds. Being able to project cold backgrounds enables the projector to simulate high-altitude exoatmospheric engagements. Previous tests with the KVACC projection system have used only one resistive-array projection device. In order to realistically stimulate a 2-color seeker, it is necessary to project in two, independently controlled IR bands. Missile interceptors commonly use two or more colors; thus, a 2-color projection capability has been developed for the KVACC system. The 2- color projection capability is being accomplished by optically combining two Phase 3 WISP arrays with a dichroic beam combiner. Both WISP arrays are cooled to user-selected temperatures ranging from ambient temperature to below 150 K. In order to test the projection system, a special-purpose camera has also been developed. The camera is designed to operate inside the vacuum chamber. It has a cooled, all- reflective broadband optical system to enable the measurement of low radiance levels in the 3 - 12 micrometer spectrum. Camera upgrades later this year will allow measurements in two independent wavebands. Both the camera and the projector will be described in this paper.

Paper Details

Date Published: 12 July 2000
PDF: 12 pages
Proc. SPIE 4027, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V, (12 July 2000); doi: 10.1117/12.391692
Show Author Affiliations
David S. Flynn, Consultant for MacAulay-Brown Inc. (United States)
Steven Arthur Marlow, Sverdrup Technology Inc. (United States)
James R. Kircher, AEgis Technologies Group (United States)
Eric W. Glattke, MacAulay-Brown Inc. (United States)
Robert Lee Murrer Jr., Air Force Research Lab. (United States)
John S. Weir, Air Force Research Lab. (United States)

Published in SPIE Proceedings Vol. 4027:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V
Robert Lee Murrer Jr., Editor(s)

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