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Proceedings Paper

Advanced real-time dynamic scene generation techniques for improved performance and fidelity
Author(s): Mark H. Bowden; James A. Buford; Anthony J. Mayhall
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Paper Abstract

Recent advances in real-time synthetic scene generation for Hardware-in-the-loop (HWIL) testing at the U.S. Army Aviation and Missile Command (AMCOM) Aviation and Missile Research, Development, and Engineering Center (AMRDEC) improve both performance and fidelity. Modeling ground target scenarios requires tradeoffs because of limited texture memory for imagery and limited main memory for elevation data. High- resolution insets have been used in the past to provide better fidelity in specific areas, such as in the neighborhood of a target. Improvements for ground scenarios include smooth transitions for high-resolution insets to reduce high spatial frequency artifacts at the borders of the inset regions and dynamic terrain paging to support large area databases. Transport lag through the scene generation system, including sensor emulation and interface components, has been dealt with in the past through the use of sub-window extraction from oversize scenes. This compensates for spatial effects of transport lag but not temporal effects. A new system has been developed and used successfully to compensate for a flashing coded beacon in the scene. Other techniques have been developed to synchronize the scene generator with the seeker under test (SUT) and to model atmospheric effects, sensor optic and electronics, and angular emissivity attenuation.

Paper Details

Date Published: 12 July 2000
PDF: 8 pages
Proc. SPIE 4027, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V, (12 July 2000); doi: 10.1117/12.391685
Show Author Affiliations
Mark H. Bowden, CG2, Inc. (United States)
James A. Buford, U.S. Army Aviation and Missile Command (United States)
Anthony J. Mayhall, Boeing Phantom Works (United States)

Published in SPIE Proceedings Vol. 4027:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing V
Robert Lee Murrer, Editor(s)

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